Atomic Force Microscopy (AFM)
Atomic Force Microscopy (AFM) is often called the "Eye of Nanotechnology".
AFM is a high-resolution imaging technique that can resolve features as small as an atomic lattice,
for either conductive or non-conductive samples. AFM provides high-resolution and three-dimensional
information, with little sample preparation. The technique makes it possible to image in-situ,
in fluid, under controlled temperature and in other controlled environments.
Topography of gold on quartz crystal (used in quartz crystal microbalance (QCM))
Topography of gold coated mica