Atomic Force Microscopy (AFM)

Atomic Force Microscopy (AFM) is often called the "Eye of Nanotechnology". AFM is a high-resolution imaging technique that can resolve features as small as an atomic lattice, for either conductive or non-conductive samples. AFM provides high-resolution and three-dimensional information, with little sample preparation. The technique makes it possible to image in-situ, in fluid, under controlled temperature and in other controlled environments.

Topography of gold on quartz crystal (used in quartz crystal microbalance (QCM))


Topography of gold coated mica