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  Atomic Force Microscopy

 

Atomic Force Microscopy (AFM)

Atomic Force Microscopy (AFM) is often called the "Eye of Nanotechnology". AFM is a high-resolution imaging technique that can resolve features as small as an atomic lattice, for either conductive or non-conductive samples. AFM provides high-resolution and three-dimensional information, with little sample preparation. The technique makes it possible to image in-situ, in fluid, under controlled temperature and in other controlled environments.

 


Topography of gold on quartz crystal (used in quartz crystal microbalance (QCM))


Topography of gold coated mica

Ohio University
Russ College of Engineering
Department of Chemical Engineering
Institute for Corrosion

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Institute for Corrosion and Multiphase Technology
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342 West State Street
Athens, Ohio 45701
United States of America
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